Publié le 29/10/2009 |

Marc Benveniste (STMicroelectronics) presented at the Smart Event 2009, an article entitled “A Proved “Correct by Construction” Memory Protection Unit”, in relation with the Forcoment Project, developed in collaboration with CLEARSY and its B tool, Atelier B. His presentation, addressed more specifically :

  • The memory protection unit (MPU) used in the new ST23 family of product
  • Main design steps followed to achieve the development of code
  • Comparison with the code for the same macro-cell developed in a traditional flow.

Discover SMART EVENT 2009 Web Site.